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Important Results:
===================================================================================================================================== >> Hydrogen Bending ModesVibrational lifetimes of hydrogen and deuterium related bending modes in semiconductors are measured by transient bleaching spectroscopy and high-resolution infrared absorption spectroscopy. The vibrational lifetime T1 = 12.2 ± 0.8 ps for the bending mode of H2* in Si. We find that the vibrational lifetimes follow a universal frequency-gap law, i.e., the decay time increases exponentially with increasing decay order, with values ranging from 1 ps for a one-phonon process to 265 ps for a four-phonon process. The temperature dependence of the lifetime shows that the bending mode decays by lowest-order multi-phonon process. Our results provide new insights into vibrational decay and the giant isotope effect of hydrogen in semiconductor systems. Reference:
<< Back :: Structure Dependent Llifetimes :: >> Next :: Interstitial Oxygen in Si and Ge :: Funding: NSF, DoE, Jeffress Foundation
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